Authors:	S. Dwivedi, T. Van Vaerenbergh, A. Ruocco, T. Spuesens, P. Bienstman, P. Dumon, W. Bogaerts
Title:	Measurements of Effective Refractive Index of SOI Waveguides using Interferometers
Format:	International Conference Proceedings
Publication date:	6/2015
Journal/Conference/Book:	Integrated Photonics Research, Silicon and Nano Photonics (IPR 2015)
Volume(Issue):	p.IM2A.6
Location:	Boston, United States
DOI:	10.1364/iprsn.2015.im2a.6
Citations:	10 (Dimensions.ai - last update: 17/11/2024) 4 (OpenCitations - last update: 27/6/2024) Look up on Google Scholar
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Abstract

We demonstrate an accurate method of measuring the effective refractive index of SOI waveguides in the C-band using three Mach-Zehnder Interferometers. Over wafer the average extraction error of effective index and group index is 0.003 and 0.004.

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