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Spectrometers using multiplexed spectral filters

Research Area: Silicon photonics for lab-on-chip spectroscopy

Main Researcher: Alfonso Ruocco

High resolution spectrometers are typically relatively bulky and sensitive components , making it difficult to integrate them in a relatively low-cost device such as sensors or point-of-care diagnostic tools. SOI technology allow extremely small optical circuits. In addition, these can be realized in CMOS mass fabrication. A wide range of passive wavelength filters can be used for spectral analysis purpose, however , processing limitations affect the performances of the wavelength filters. These limitations can be overcame combining different passive components and by adding techniques such as active tuning, driving and modulation to them. By combining these techniques to passive spectrometers there are a number of new ways to enhance the performance of the device.

Other people involved:

Publications

    International Journals

  1. A. Ruocco, D. Van Thourhout, W. Bogaerts, Silicon Photonic Spectrometer for Accurate Peak Detection using the Vernier Effect and Time-Domain Multiplexing, Journal of Lightwave Technology, p.3351 - 3357 (2014)  Download this Publication (1.1MB).
      International Conferences

    1. A. Ruocco, J. Juan Colás , W. Bogaerts, Microring Resonator Refractive Index Sensor with Integrated Spectrometer, 12th International Conference on Group IV Photonics (GFP), Canada, p.WP49 (2015)  Download this Publication (970KB).
    2. A. Ruocco, W. Bogaerts, Fully Integrated SOI Wavelength Meter Based on Phase Shift Technique, 12th International Conference on Group IV Photonics (GFP), Canada, p.WP48 (2015).
    3. A. Ruocco, D. Van Thourhout, W. Bogaerts, Silicon Photonic Accurate Wavelength Detection using an AWG and Time-Domain Multiplexing, 11th International Conference on Group IV Photonics (GFP), France, p.215-216 (2014)  Download this Publication (1.6MB).

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