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Mr. Joris Geessels (Support Staff)
This person worked in the group from 2013 till 214.
Publications (3)International Journals
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Y. Xing, M. Wang, A. Ruocco, J. Geessels, U. Khan, W. Bogaerts,
A Compact Silicon Photonics Circuit to Extract Multiple Parameters for Process Control Monitoring, OSA Continuum, 3(2), p.379-390 doi:10.1364/OSAC.383711 (2020) .
International Conferences
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W. Bogaerts, Y. Xing, Y. Ye, U. Khan, J. Dong, J. Geessels, M. Fiers, D. Spina, T. Dhaene,
Predicting Yield of Photonic Circuits With Wafer-scale Fabrication Variability, 2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) (invited), United States, p.1-3 doi:10.1109/NEMO.2019.8853660 (2019) .
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Y. Xing, M. Wang, A. Ruocco, J. Geessels, U. Khan, W. Bogaerts,
Extracting Multiple Parameters from a Compact Circuit for Performance Evaluation, European Conference on Integrated Optics (ECIO 2019), Belgium, p.W.Po1.9 (2019) .
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