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Authors: G. Morthier, P. Verhoeve, R. Baets, R. Schatz
Title: Extraction of a large set of laser parameters from different measurements
Format: International Conference Proceedings
Publication date: 10/1996
Journal/Conference/Book: Proc. of the 15th IEEE Int. Semiconductor Laser Conf.
Volume(Issue): p.175-176
Location: Haifa, Israel
Internal Reference: [O-514]
DOI: 10.1109/islc.1996.558796
Citations: 1 ( - last update: 19/5/2024)
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