| Authors: | P. Verhoeve, G. Diet, G. Sarlet, G. Morthier, R. Baets, T. Farrell | | Title: | OLIMPEX: measurement and parameter extraction tools for advanced laser diodes | | Format: | International Conference Proceedings | | Publication date: | 11/1997 | | Journal/Conference/Book: | Proc. of the IEEE/LEOS Benelux-Chapter 1997
| | Volume(Issue): | p.109-112 | | Location: | Eindhoven University of Technology, Netherlands | | Internal Reference: | [O-652] | | Citations: | Look up on Google Scholar
|
|
|
