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Authors: W.C.L. Hopman, K.O. van der Werf, A.J.F. Hollink, W. Bogaerts, V. Subramaniam, R.M. de Ridder
Title: Modeling and Experimental Verification of the Dynamic Interaction of an AFM-Tip With a Photonic Crystal Microcavity
Format: International Journal
Publication date: 1/2008
Journal/Conference/Book: IEEE Photonics Technology Letters
Volume(Issue): 20(1) p.57-59
DOI: 10.1109/lpt.2007.911519
Citations: 4 ( - last update: 14/7/2024)
4 (OpenCitations - last update: 3/5/2024)
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We present a transmission model for estimating the
effect of the atomic-force microscopy tapping tip height on a photonic crystal microcavity (MC). This model uses a fit of the measured tip-height-dependent transmission above a “hot spot” in the MC. The predicted transmission versus average tapping height is
in good agreement with the values obtained from tapping mode experiments. Furthermore, we show that for the existing, nonoptimized structure, the transmission coefficient can be tuned between 0.32 and 0.8 by varying the average tapping height from 26 to
265 nm. A transmission larger than that of the undisturbed cavity at resonance was observed at specific tip locations just outside the cavity-terminating holes.

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