Authors:	R. Kumar, T. Spuesens, P. Mechet, P. Kumar, O.Raz, N. Olivier, J.- M. Fedeli, G. Roelkens, R. Baets, D. Van Thourhout, G. Morthier
Title:	Ultra-fast and Bias-free All-Optical Wavelength Conversion Using III-V on Silicon Technology
Format:	International Journal
Publication date:	7/2011
Journal/Conference/Book:	Optics Letters
Editor/Publisher:	OSA,
Volume(Issue):	36(13) p.2450-2452
DOI:	10.1364/ol.36.002450
Citations:	10 (Dimensions.ai - last update: 21/4/2024) 8 (OpenCitations - last update: 3/5/2024) Look up on Google Scholar
Download:	(570KB)

Abstract

Using a 7.5 micron diameter disk fabricated with III-V-on-silicon fabrication technology, we demonstrate a bias-free all-optical wavelength conversion for a non-return to zero on-off keyed pseudo-random bit sequence data at the speed of 10Gbps with an extinction ratio of more than 12dB. The working principle of such a wavelength converter is based on the free carrier induced refractive index modulation in a pump-probe configuration. We believe it to be the first bias-free on-chip demonstration of all-optical wavelength conversion using pseudo-random bit sequence data. All-optical gating measurements in the pump-probe configuration with the same device have revealed that it’s possible to achieve wavelength conversion beyond 20 Gbps.

Related Research Topics

• III-V on silicon microdisk lasers (2008-2014)

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