Authors: | P. Merken, R. Vandersmissen, G. Yurtsever | Title: | OCT supports industrial nondestructive depth analysis | Format: | International Journal | Publication date: | 8/2011 | Journal/Conference/Book: | Laser Focus World
| Editor/Publisher: | PENNWELL PUBL CO, | Volume(Issue): | 47(8) p.82 | Citations: | Look up on Google Scholar
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