| Authors: | A. Hope, T.G. Nguyen, W. Bogaerts, A. Mitchell | | Title: | Experimental Demonstration of TM Lateral Leakage in a Standard SOI Photonics Platform. | | Format: | International Conference Proceedings | | Publication date: | 8/2014 | | Journal/Conference/Book: | 11th International Conference on Group IV Photonics (GFP)
| | Volume(Issue): | p.77-78 | | Location: | Paris, France | | DOI: | 10.1109/group4.2014.6962028 | | Citations: | 2 (Dimensions.ai - last update: 17/11/2024)
2 (OpenCitations - last update: 27/6/2024)
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Abstract
We provide an experimental demonstration of the width dependent losses of the fundamental TM guided mode in fabricated silicon-on-insulator shallow etched ridge waveguides |
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