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Authors: M. Hsu, M. Pantouvaki, C. Merckling, A. Marinelli, J. Van Campenhout, P. Absil, D. Van Thourhout
Title: Design of thin film stacks for non-destructive electro-optical characterizations by spectroscopic ellipsometry
Format: International Conference Proceedings
Publication date: 11/2016
Journal/Conference/Book: Proceedings Symposium IEEE Photonics Society Benelux
Volume(Issue): p.65-68
Location: Gent, Belgium
Citations: Look up on Google Scholar
Download: Download this Publication (261KB) (261KB)

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