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Authors: M. Hsu, C. Merckling, S. El Kazzi, M. Pantouvaki, O. Richard, H. Bender, J. Meersschaut, J. Van Campenhout, P. Absil, D. Van Thourhout
Title: Diffraction studies for stoichiometry effects in BaTiO3 grown by molecular beam epitaxy on Ge(001)
Format: International Journal
Publication date: 12/2016
Journal/Conference/Book: Journal of Applied Physics
Volume(Issue): 120 p.225114
DOI: 10.1063/1.4972101
Citations: 4 (Dimensions.ai - last update: 1/3/2021)
3 (OpenCitations - last update: 15/2/2021)
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