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Authors: A. Diaz Tormo , D. Khalenkow, A. G. Skirtach, N. Le Thomas
Title: 4π Microscopy Immune to Sample-Induced Dephasing
Format: International Conference Proceedings
Publication date: 9/2018
Journal/Conference/Book: IEEE Photonics Conference (IPC2018)
Volume(Issue): p.259
Location: Reston, Virginia, United States
Internal Reference: [N-2278]

Abstract

In 4π microscopy it is commonly assumed that the point spread function is unaffected by the sample, a big assumption considering that cell studies have reported sample-induced phase changes of more than a wavelength. Here we describe a method that does away with that assumption.

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