| Authors: | H. Becker, C.J. Krückel, D. Van Thourhout, M.J.R. Heck | | Title: | Simulation and Experimental Characterization of Compact Out-of-Plane Focusing Grating Couplers on 220 nm-SOI platform | | Format: | International Conference Presentation | | Publication date: | 4/2019 | | Journal/Conference/Book: | European Conference on Integrated Optics
| | Location: | Ghent, Belgium | | Citations: | Look up on Google Scholar
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Abstract
We present the design and characterization of compact out-of-plane focusing grating couplers on a
silicon photonic platform, based on the fabrication restrictions for standard 193 nm UV lithography.
The characterization by spatially sweeping a lensed fibre across the grating couplers clearly reveals
the focusing behaviour and validates the design based on phase matching conditions for the one- and
two-dimensional case. To our knowledge, this makes these grating couplers the first experimentally
demonstrated 2D out-of-plane focusing grating couplers on a standard 220 nm-SOI platform. These
grating couplers can find application as optical photonic layer couplers in optical sensing, as vertical
interconnects, or to address spintronic memory elements. |
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