| Authors: | C. Lin, David Schaubroeck, R. Baets, Nico Boon, N. Le Thomas | | Title: | UV Photonic-Integrated-Circuits-Based Structured Illumination Microscopy With a Field of View Larger than 100 µm2 | | Format: | International Journal | | Publication date: | 2/2023 | | Journal/Conference/Book: | IEEE Journal on Selected Topics in Quantum Electronics
| | Volume(Issue): | 29(4) p.1-9 | | DOI: | 10.1109/JSTQE.2023.3243776 | | Citations: | 2 (Dimensions.ai - last update: 14/4/2024)
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Abstract
Abstract-Photonic integrated circuits (PICs) are expected to add practicality and new functionalities in a considerable number of optical applications, including optical microscopy. Here, we present a PIC design allowing a far-field structured UV illumination pattern with a fringe period as low as 370 nm, a fringe visibility of 0.83 over a field of views of more than 150 µm~ 200µm and a radiant intensity as large as 0.49 mW. The circuits include single mode waveguides with propagation losses of 3 dB/cm at a wavelength λ = 360 nm, two diffraction gratings for beam shaping out of the chip plane, a beam splitter and a phase shifter. Using fluorescent gratings with pitches longer or shorter than the wavelength, as control objects, and a collecting lens with a numerical aperture of 0.5, the current PICs
enable to highlight experimentally the Moire pattern at the heart of the optical resolution enhancement and to achieve a doubling of the optical resolution in the direction of the illumination. Related Research Topics
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