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Authors: M. Zenari, M. Buffolo, M. Fornasier, C. De Santi, J. Goyvaerts, A.Grabowski, J. Gustavsson, S. Kumari, A. Stassren, R. Baets, A. Larsson, G. Roelkens, G. Meneghesso, E. Zanoni, M. Meneghini
Title: Understanding the Optical Degradation of 845 nm Micro-Transfer-Printed VCSILs for Photonic Integrated Circuits
Format: International Journal
Publication date: 6/2023
Journal/Conference/Book: IEEE Journal of Quantum Electronics
Volume(Issue): 59(4) p.article 2400210 (10 pages)
DOI: 10.1109/JQE.2023.3283514
Citations: 3 ( - last update: 21/7/2024)
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