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Authors: F. Clauwaert, P. Van Daele, R. Baets, P. Lagasse
Title: characterization of device isolation in GaAs MESFET circuits by boron implantation
Format: International Journal
Publication date: 3/1986
Journal/Conference/Book: Journal of the Electrochemical Society
Volume(Issue): 134(3) p.711-714
Internal Reference: [O-277]
DOI: 10.1149/1.2100537
Citations: 12 (Dimensions.ai - last update: 22/1/2023)
9 (OpenCitations - last update: 26/4/2023)
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