Photonics Research Group Home
Ghent University Journals/Proceedings
About People Research Publications Education Services


Publication detail

Authors: F. Clauwaert, P. Van Daele, R. Baets, P. Lagasse
Title: characterization of device isolation in GaAs MESFET circuits by boron implantation
Format: International Journal
Publication date: 3/1986
Journal/Conference/Book: Journal of the Electrochemical Society
Volume(Issue): 134(3) p.711-714
Internal Reference: [O-277]
DOI: 10.1149/1.2100537
Citations: 11 ( - last update: 14/7/2024)
9 (OpenCitations - last update: 26/4/2024)
Look up on Google Scholar
Citations (OpenCitations)

Back to publication list