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Authors: R. Kumar, T. Spuesens, P. Mechet, P. Kumar, O.Raz, N. Olivier, J.- M. Fedeli, G. Roelkens, R. Baets, D. Van Thourhout, G. Morthier
Title: Ultra-fast and Bias-free All-Optical Wavelength Conversion Using III-V on Silicon Technology
Format: International Journal
Publication date: 7/2011
Journal/Conference/Book: Optics Letters
Editor/Publisher: OSA, 
Volume(Issue): 36(13) p.2450-2452
DOI: 10.1364/ol.36.002450
Citations: 10 ( - last update: 14/7/2024)
8 (OpenCitations - last update: 3/5/2024)
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Using a 7.5 micron diameter disk fabricated with III-V-on-silicon fabrication technology, we demonstrate a bias-free all-optical wavelength conversion for a non-return to zero on-off keyed pseudo-random bit sequence data at the speed of 10Gbps with an extinction ratio of more than 12dB. The working principle of such a wavelength converter is based on the free carrier induced refractive index modulation in a pump-probe configuration. We believe it to be the first bias-free on-chip demonstration of all-optical wavelength conversion using pseudo-random bit sequence data. All-optical gating measurements in the pump-probe configuration with the same device have revealed that it’s possible to achieve wavelength conversion beyond 20 Gbps.

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