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Authors: A. Hope, T.G. Nguyen, W. Bogaerts, A. Mitchell
Title: Experimental Demonstration of TM Lateral Leakage in a Standard SOI Photonics Platform.
Format: International Conference Proceedings
Publication date: 8/2014
Journal/Conference/Book: 11th International Conference on Group IV Photonics (GFP)
Volume(Issue): p.77-78
Location: Paris, France
DOI: 10.1109/group4.2014.6962028
Citations: 1 (Web of Knowledge / Dimensions.ai - last update: 15/9/2020)
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Abstract

We provide an experimental demonstration of the width dependent losses of the fundamental TM guided mode in fabricated silicon-on-insulator shallow etched ridge waveguides


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