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Authors: A. Ruocco, M. Fiers, M. Vanslembrouck, T. Van Vaerenbergh, W. Bogaerts
Title: Multi-parameter extraction from SOI photonic integrated circuits using circuit simulation and evolutionary algorithms
Format: International Conference Proceedings
Publication date: 2/2015
Journal/Conference/Book: Proc. SPIE, Smart Photonic and Optoelectronic Integrated Circuits XVII
Editor/Publisher: SPIE, 
Volume(Issue): 9366 p.936606
Location: San Francisco, United States
DOI: 10.1117/12.2077564
Citations: 2 (Web of Knowledge / Dimensions.ai - last update: 27/9/2020)
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Abstract

We presented an efficient parameter extraction from SOI based lattice filters using the CAPHE circuit simulator and a CMA evolution strategy. We extract wavelength dependent optical parameters of the waveguides and the directional couplers. The parameters match very well with the simulations results. The method is highly suitable for wafer scale tests and for statistical data analysis, and allows a correlation between fabrication statistics and functional statistics.

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