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Publication detail

Authors: A. Ruocco, W. Bogaerts
Title: Fully Integrated SOI Wavelength Meter Based on Phase Shift Technique
Format: International Conference Proceedings
Publication date: 8/2015
Journal/Conference/Book: 12th International Conference on Group IV Photonics (GFP)
Volume(Issue): p.WP48
Location: Vancouver, Canada
DOI: 10.1109/group4.2015.7305985
Citations: 5 (Web of Knowledge / Dimensions.ai - last update: 27/9/2020)
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Abstract

We present an MZI (Mach-Zehnder Interferometer) silicon-on-insulator (SOI) wavelength meter. The device integrates photo detectors and modulators. The phase shift between carrier and modulated signal is linearly correlated to the input wavelength.

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