| Authors: | M. Hsu, M. Pantouvaki, C. Merckling, A. Marinelli, J. Van Campenhout, P. Absil, D. Van Thourhout | | Title: | Design of thin film stacks for non-destructive electro-optical characterizations by spectroscopic ellipsometry | | Format: | International Conference Proceedings | | Publication date: | 11/2016 | | Journal/Conference/Book: | Proceedings Symposium IEEE Photonics Society Benelux
| | Volume(Issue): | p.65-68 | | Location: | Gent, Belgium | | Citations: | Look up on Google Scholar
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