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Authors: A. Vasiliev, M. Muneeb, R. Baets, G. Roelkens
Title: High Resolution Silicon-on-Insulator Mid-Infrared Spectrometers operating at 3.3 um
Format: International Conference Proceedings
Publication date: 7/2017
Journal/Conference/Book: IEEE Photonics Society Summer Topicals 2017
Volume(Issue): p.177-178
Location: San Juan, Puerto Rico
DOI: 10.1109/phosst.2017.8012708
Citations: 1 (Dimensions.ai - last update: 6/10/2024)
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Abstract

The characterization of silicon-on-insulator arrayed
waveguide grating wavelength (de)multiplexers operating at 3.3 um is reported. The filters have a channel spacing between 200 GHz and 50 GHz and feature low insertion loss (2-3dB), low crosstalk level (20 dB) and low waveguide loss (2.6 dB/cm).

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