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Authors: M. Zenaria, M. Buffolo, M. Fornasier, C. De Santi, J. Goyvaerts, A. Grabowsky, J. Gustavsson, S. Kumari, A. Stassren, R. Baets, A. Larsson, G. Roelkens, G. Meneghesso, E. Zanoni, M. Meneghini
Title: Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits
Format: International Conference Proceedings
Publication date: 3/2023
Journal/Conference/Book: Proc. SPIE 12439, Vertical-Cavity Surface-Emitting Lasers XXVII
Volume(Issue): 12439 p.paper 24390E (9 pages)
Location: San Francisco, United States
DOI: 10.1117/12.2655696
Citations: Look up on Google Scholar
Download: Download this Publication (463KB) (463KB)

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