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Authors: M. Zenari, M. Buffolo, C. De Santi, J. Goyvaerts, A. Grabowski, J. Gustavsson, S. Kumari, A. Stassren, R. Baets, A. Larsson, G. Roelkens, G. Meneghesso, E. Zanoni, M. Meneghini
Title: Modeling the electrical degradation of micro-transfer printed 845nm VCSILs for silicon photonics
Format: International Journal
Publication date: 1/2023
Journal/Conference/Book: Transactions on Electron Devices
Volume(Issue): 71(2) p.1131-1138
DOI: 10.1109/TED.2023.3346370
Citations: 1 (Dimensions.ai - last update: 7/7/2024)
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