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Authors: F. Pavanello, E. Vatajelu, A. Bossio, T. Van Vaerenbergh, P. Bienstman, B. Charbonnier, A. Carpegna, S. Di Carlo, A. Savino
Title: Neuromorphic hardware design and reliability from traditional CMOS to emerging technologies
Format: International Conference Proceedings
Publication date: 4/2023
Journal/Conference/Book: IEEE VLSI Test Symposium (VTS)
Editor/Publisher: IEEE, 
Volume(Issue): p.10
Location: San Diego, United States
DOI: 10.1109/VTS56346.2023.10139932
Citations: Look up on Google Scholar

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