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Authors: B. Kunert, W. Guo, Y. Mols, B. Tian, Z. Wang, Y. Shi, D. Van Thourhout, M. Pantouvaki, J. Van Campenhout, R. Langer, K. Barla
Title: III/V nano ridge structures for optical applications on patterned 300 mm silicon substrate
Format: International Journal
Publication date: 12/2016
Journal/Conference/Book: Applied Physics Letters
Volume(Issue): 109(9)
Internal Reference: [N-1920]
Download: Download this Publication (1.3MB) (1.3MB)

Abstract

We report on an integration approach of III/V nano ridges on patterned silicon (Si) wafers by metal organic vapor phase epitaxy (MOVPE). Trenches of different widths (≤500 nm) were processed in a silicon oxide (SiO2) layer on top of a 300 mm (001) Si substrate. The MOVPE growth conditions were chosen in a way to guarantee an efficient defect trapping within narrow trenches and to form a box shaped ridge with increased III/V volume when growing out of the trench. Compressively strained InGaAs/GaAs multi-quantum wells with 19% indium were deposited on top of the fully relaxed GaAs ridges as an active material for optical applications. Transmission electron microcopy investigation shows that very flat quantum well (QW) interfaces were realized. A clear defect trapping inside the trenches is observed whereas the ridge material is free of threading dislocations with only a very low density of planar defects. Pronounced QW photoluminescence (PL) is detected from different ridge sizes at room temperature. The potential of these III/V nano ridges for laser integration on Si substrates is emphasized by the achieved ridge volume which could enable wave guidance and by the high crystal quality in line with the distinct PL.

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