| Authors: | F. Pavanello, A. Vasiliev, M. Muneeb, G. Roelkens | | Title: | Broadband Digital Fourier Transform Spectrometer for On-Chip Wavelength Monitoring in the 2.3-um Wavelength Range | | Format: | International Journal | | Publication date: | 5/2019 | | Journal/Conference/Book: | IEEE Photonics Journal
| | Volume(Issue): | 11(3) p.1-9 | | DOI: | 10.1109/JPHOT.2019.2914013 | | Citations: | 4 (Dimensions.ai - last update: 21/4/2024)
1 (OpenCitations - last update: 19/4/2024)
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Abstract
We demonstrate a broadband digital Fourier Transform(dFT) spectrometer addressing
wavelength monitoring applications in the 2.3 μm wavelength range. The spectrometer is built in
a silicon-on-insulator (SOI) platform and the design allows its fabrication with CMOS-compatible
tools. We report an operating bandwidth of 130 nm around 2.3 μm wavelength using an efficient
algorithm for sparse spectra to retrieve the wavelength with an accuracy of 100 pm. The spectrometer can also resolve two laser lines 0.5 nm apart. Related Research Topics
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