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Authors: V.S. Volkov, S.L. Bozhevolnyi, D. Taillaert
Title: Near-field imaging of light diffraction out of slab waveguides
Format: International Journal
Publication date: 6/2004
Journal/Conference/Book: Laser Physics Letters
Volume(Issue): 1(6) p.311-316
DOI: 10.1002/lapl.200410072
Citations: 7 ( - last update: 9/6/2024)
6 (OpenCitations - last update: 3/5/2024)
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A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PhC) slabs, which combine slab waveguides with in-plane PhCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light diffraction is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along diffraction gratings measured at different wavelengths and/or distances from the sample surface.

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