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Mr. Jiaxing Dong 

This person worked in the group from 2017 till 2018.

Affiliation: Ghent University - IMEC
Information Technology
E-mail: jiaxing.dong@ugent.be
Research Area: Variability modeling and yield analysis
Promotor: Wim Bogaerts

Specific Research Topics

Publications (3)

    International Journals

  1. Y. Xing, J. Dong, S. Dwivedi, U. Khan, W. Bogaerts, Accurate Extraction of Fabricated Geometry Using Optical Measurement, Photonics Research, 6 (11), p.1008-1020 doi:10.1364/PRJ.6.001008 (2018)  Download this Publication (3.5MB).
      International Conferences

    1. W. Bogaerts, Y. Xing, Y. Ye, U. Khan, J. Dong, J. Geessels, M. Fiers, D. Spina, T. Dhaene, Predicting Yield of Photonic Circuits With Wafer-scale Fabrication Variability, 2019 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) (invited), United States, p.1-3 doi:10.1109/NEMO.2019.8853660 (2019)  Download this Publication (1MB).
    2. Y. Xing, J. Dong, U. Khan, Y. Ye, D. Spina, T. Dhaene, W. Bogaerts, From Parameter Extraction, Variability Models to Yield_Prediction, Latin America Optics & Photonics Conference (invited), Peru, p.paper W3E.1 (3 pages) doi:10.1364/LAOP.2018.W3E.1 (2018)  Download this Publication (1.5MB).
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