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Authors: Y. Xing, J. Dong, U. Khan, Y. Ye, D. Spina, T. Dhaene, W. Bogaerts
Title: From Parameter Extraction, Variability Models to Yield_Prediction
Format: International Conference Presentation
Publication date: 11/2018
Journal/Conference/Book: Latin America Optics & Photonics Conference (invited)
Editor/Publisher: OSA, 
Volume(Issue): p.paper W3E.1 (3 pages)
Location: Lima, Peru
DOI: 10.1364/LAOP.2018.W3E.1
Citations: 2 ( - last update: 14/7/2024)
2 (OpenCitations - last update: 19/4/2024)
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We will discuss methods and workflow of variability analysis and yield prediction for integrated photonic circuits, describing the process from wafer-scale parameter extraction over spatial variability modelling to layout-aware yield prediction of photonic circuits.

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