Authors:	J. Brouckaert, S. Selvaraja, W. Bogaerts, G. Roelkens, M.Y. Ling, J. Allaert, P. Dumon, D. Van Thourhout, R. Baets
Title:	Silicon-on-Insulator Microspectrometer
Format:	International Conference Proceedings
Publication date:	11/2008
Journal/Conference/Book:	13th Annual Symposium of the IEEE/LEOS Benelux chapter
Volume(Issue):	p.7-10
Location:	Netherlands
Citations:	Look up on Google Scholar
Download:	(456KB)

Related Research Topics

• Silicon (nano)photonic devices fabrication with 193nm and 248nm (DUV) Optical lithography (1999-2012)
• Die-to-wafer bonding technology (2003-2012)
• Photo-spectrometer based on heterogeneous integration (2004-2009)

Related Projects

• IWT: epSOC (electro-photonic System-On-Chip)