| Authors: | A. Li, Y. Xing, R. Van Laer, R. Baets, W. Bogaerts | | Title: | Extreme Spectral Transmission Fluctuations in Silicon Nanowires Induced by Backscattering | | Format: | International Conference Presentation | | Publication date: | 8/2016 | | Journal/Conference/Book: | IEEE International Conference on Group IV Photonics 2016
| | Editor/Publisher: | IEEE, | | Volume(Issue): | p.paper FB4 (2 pages) | | Location: | Shanghai, China | | DOI: | 10.1109/GROUP4.2016.7739068 | | Citations: | 4 (Dimensions.ai - last update: 17/11/2024)
2 (OpenCitations - last update: 27/6/2024)
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Abstract
The waveguide is the most fundamental component of integrated photonic circuits. We observe that roughness-induced backscattering in high-contrast silicon waveguides generates over 10 dB spectral transmission variations in centimeter-long silicon waveguides. Related Research Topics
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