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FWO: ScaleModel

Full Name:Scalable behavioral models for large-scale silicon photonics

Duration: 1/1/2014-31/12/2017


  • UGent - INTEC - PRG
  • UGent - INTEC - SUMO


  • Silicon Photonics is the first technology that allows for large-scale integrated circuits. Efficient circuit design techniques is becoming an increasing bottleneck. In this project we develop reliable behavioral models vor silicon photonic building blocks, and analyse the impact of variability. Finally we want to apply variability analysis (e.g. Polynomial Chaos) to predict the impact of variability on larger circuits.

People involved

Research topics involved

Publications in the framework of this project (15)

    International Journals

  1. W. Bogaerts, L. Chrostowski, Silicon Photonics Circuit Design, Lasers & Photonics Reviews (invited), p.1700237 (29 pages) (2018)  Download this Publication (2.8MB).
  2. A. Kaintura, D. Spina, I. Couckuyt, L.Knockaert, W. Bogaerts, T. Dhaene, A Kriging and Stochastic Collocation ensemble for uncertainty quantification in engineering applications, Engineering with Computers, p.1-15 (2017)  Download this Publication (2.5MB).
  3. A. Li, W. Bogaerts, Fundamental Suppression of Backscattering in Silicon Microrings, Optics Express, 25(3), p.2092-2099 (2017)  Download this Publication (2.5MB).
  4. A. Li, T. Van Vaerenbergh, P. De Heyn, P. Bienstman, W. Bogaerts, Backscattering in Silicon Microring Resonators: A Quantitative Analysis, Laser & Photonics Reviews, 10(3), p.420-431 (2016)  Download this Publication (1.3MB).
  5. Y. Xing, D. Spina, A. Li, T. Dhaene, W. Bogaerts, Stochastic Collocation for Device-level Variability Analysis in Integrated Photonics, Photonics Research, (2016)  Download this Publication (782KB).
  6. S. Dwivedi, A. Ruocco, M. Vanslembrouck, T. Spuesens, P. Bienstman, P. Dumon, T. Van Vaerenbergh, W. Bogaerts, Experimental Extraction of Effective Refractive Index and Thermo-Optic Coefficients of Silicon-On-Insulator Waveguides using Interferometers, Journal of Lightwave Technology , 33(21), p.4471 - 4477  (2015)  Download this Publication (854KB).
      International Conferences

    1. Y. Xing, M. Khan, Y. Ye, W. Bogaerts, Extracting Fabricated Geometry on Die-Level, 2017 IEEE Photonics Scociety Benelux Annual Symposium, Netherlands, p.148-151 (2017)  Download this Publication (618KB).
    2. Y. Xing, M. Khan, A. Ribeiro, W. Bogaerts, Behavior Model for Directional Coupler, 2017 IEEE Photonics Scociety Benelux Annual Symposium, Netherlands, (2017)  Download this Publication (657KB).
    3. A. Li, Y. Xing, W. Bogaerts, An integrated tunable reflector, European Conference on Integrated Optics (ECIO, Netherlands, p.paper W3.1 (2017)  Download this Publication (971KB).
    4. W. Bogaerts, Scaling Up Silicon Photonic Circuits: Where Are the Challenges?, International Workshop on Optical/Photonic Interconnects for Computing Systems (OPTICS Workshop) (invited), 3, Switzerland, (2017)  Download this Publication (275KB).
    5. A. Li, Y. Xing, R. Van Laer, R. Baets, W. Bogaerts, Extreme Spectral Transmission Fluctuations in Silicon Nanowires Induced by Backscattering, IEEE International Conference on Group IV Photonics 2016, China, p.paper FB4 (2 pages) (2016)  Download this Publication (2.4MB).
    6. Y. Xing, A. Li, R. Van Laer, R. Baets, W. Bogaerts, Backscatter Model for Nanoscale Silicon Waveguides , 24th International Workshop on Optical Wave & Waveguide Theory and Numerical Modelling (OWTNM 2016), Poland, p.paper OWTNM/O-18 (2016)  Download this Publication (615KB).
    7. Y. Xing, D. Spina, A. Li, T. Dhaene, W. Bogaerts, Variability analysis of device-level photonics using stochastic collocation , SPIE Photonics Europe 2016, Belgium, (2016)  Download this Publication (112KB).
    8. A. Li, T. Van Vaerenbergh, P. De Heyn, Y. Xing, P. Bienstman, W. Bogaerts, Experimentally demonstrate the origin for asymmetric resonance splitting and contributions from couplers to backscattering in SOI microrings, Integrated Photonics Research, Silicon and Nano Photonics (IPR 2015), United States, p.IM2B.6 (2015)  Download this Publication (1.4MB).
    9. S. Dwivedi, T. Van Vaerenbergh, A. Ruocco, T. Spuesens, P. Bienstman, P. Dumon, W. Bogaerts, Measurements of Effective Refractive Index of SOI Waveguides using Interferometers, Integrated Photonics Research, Silicon and Nano Photonics (IPR 2015), United States, p.IM2A.6 (2015)  Download this Publication (1.4MB).

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