| Authors: | A. Vasiliev, M. Muneeb, J. Allaert, R. Baets, G. Roelkens | | Title: | Integrated Silicon-on-Insulator AWG Spectrometer with Single Pixel Readout for 2.3 um Spectroscopy Applications | | Format: | International Conference Proceedings | | Publication date: | 5/2018 | | Journal/Conference/Book: | European Conference on Integrated Optics (ECIO
| | Volume(Issue): | p.We.2.B.4-HRP | | Location: | Valencia, Spain | | Citations: | Look up on Google Scholar
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Abstract
A compact and cheap mid-infrared spectrometer is realized by integrating a Silicon-on-Insulator (SOI)
Arrayed Waveguide Grating (AWG) spectrometer operating in the 2.3 μm wavelength range with a high performance photodiode. The AWG has twelve output channels with a spacing of 225 GHz (4 nm) and a free spectral range (FSR) of 3150 GHz (56 nm), which are simultaneously collected by a single, transistor outline (TO)-packaged extended InGaAs PIN photodiode. The response of each AWG channel is discerned by time-sequentially modulating the optical power in each output channel using integrated Mach-Zehnder based (MZI) thermo-optic modulators with a pi-phase shift power consumption of 50 mW. The photonic chip is interfaced using off-the-shelf electronic components and a standard 9/125 single-mode fiber. The response of the AWG is limited to one FSR using a 50 nm Full Width Half-Maximum (FWHM) bandpass interference filter. Using 31 μW optical power in the fiber, the absorption spectrum of a 0.5 mm thick polydimethylsiloxane sheet (PDMS) is sampled and compared to a benchtop spectrometer to good agreement. Related Research Topics
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