|Authors: ||R. Baets, P. Dumon, W. Bogaerts|
|Title: ||Hands-on: Introduction to Silicon Photonics Circuit Design|
|Format: ||International Course|
|Publication date: ||3/2019|
|Journal/Conference/Book: ||Optical Fiber Communication Conference
|Location: ||San Diego, United States|
|Citations: ||Look up on Google Scholar
In this course, we start hands-on with circuit design in silicon photonics. As fabrication technology is steadily improving, the emphasis in silicon photonic design is gradually shifting from component design to circuit design. We compose hierarchical circuits from libraries of basic building blocks, use parametric circuit models and simulation in frequency domain and time domain, and generate a circuit layout. We look into the effects of variability and imperfections on circuit performance using Monte-Carlo simulations, and learn how to design wavelength filter circuits based on Mach-Zehnder interferometers and arrayed waveguide gratings (AWG). The largest part of the course is hands-on, using an on-line learning environment based on Jupyter python notebooks powered by Luceda Photonics's IPKISS design tools. The participants can use this environment during the course session and continue to use it for a few months after the course. In that period, they will also get the opportunity to create a small design that will be fabricated using the e-beam technology developed by the Canadian SiEPIC program. This design will be characterized and the measurement data will be made available on the same learning platform for analysis.
Through this course, the participants will become familiar with the overall design flow and acquire an awareness of important do's and don'ts in photonic circuit design, especially in a high-contrast system such as silicon photonics. They will become familiar with circuit layout and simulation (time domain and wavelength domain) and the basics of integrated optical filter design. Also, they can go through the entire process of actually creating a design and analyzing the results of the measurements.
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